Bruker HYPERION II
Bruker HYPERION II – FT-IR and QCL Microscope
Category:
ADVANTAGES
APPLICATIONS
TECHNICAL SPECIFICATIONS
VIDEO
Advantages
- Combination of FT-IR and QCL/ILIM technology in one instrument
- High sensitivity and diffraction-limited spatial resolution
- FPA detectors with 64 × 64 or 128 × 128 pixels
- Infrared laser imaging in ATR, transmission, and reflection
- Patented spatial coherence reduction for artifact-free imaging
- Wide selection of MCT detectors, including thermoelectrically cooled TE-MCT
- Wide range of IR and ATR objectives
- Spectral range extension from NIR to FIR
- Flexible selection of accessories and sample stages
- Temperature-controlled measurements from −196 °C to +600 °C
- Full control over measurement parameters, samples, and experimental conditions
- OPUS software for advanced data processing and analysis
Applications
HYPERION II is designed for demanding research and industrial applications, including:
- Biological tissue and cell analysis
- Pharmaceutical research and drug development
- Polymer and plastic analysis
- Surface and coating characterization
- Microplastic analysis
- Forensic research
- Semiconductor analysis
- Industrial research and development
- Multilayer and complex material analysis
- Geology and mineralogy
- Energy materials and catalysis
- Photonic and nanomaterial research
Technical Specifications
- Technology: FT-IR microscopy and QCL/Infrared Laser Imaging
- Measurement modes: ATR, transmission, and reflection
- FPA detectors: 64 × 64 or 128 × 128 pixels
- MCT detectors: Broad-, mid-, and narrow-band LN₂-MCT; TE-MCT
- Objectives: 3.5× / 15× / 36× IR, 20× ATR, 15× GIR, 4× / 40× VIS
- Spectral range: Extendable from NIR to FIR
- FPA imaging speed: Up to 0.1 mm²/s for full-spectrum imaging
- ILIM imaging speed: Up to 6.4 mm²/s at a single wavenumber
- IR laser imaging: Optional via Infrared Laser Imaging Module (ILIM)
- Temperature-controlled measurements: −196 °C to +600 °C
- Software: OPUS
- Advanced analysis: A.I.D., Cluster ID, and automated particle analysis
- Additional options: ATR objective, Grazing Angle objective, FPA imaging, macro ATR, heating/cooling stage, and other accessories
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