Bruker LUMOS II
Bruker LUMOS II – FT-IR Microscope
Bruker LUMOS II is a standalone FT-IR microscope and IR laser imaging microscope designed for precise analysis and chemical mapping of microscopic samples. It combines FT-IR microscopy with advanced FPA imaging and IR laser imaging capabilities, enabling fast and detailed characterization of materials. The system supports ATR, transmission, and reflection measurements and offers advanced µ-ATR analysis.
ADVANTAGES
APPLICATIONS
TECHNICAL SPECIFICATIONS
VIDEO
Advantages
- Standalone FT-IR microscope with a compact design
- RockSolid™ interferometer for stable performance
- FT-IR analysis in ATR, transmission, and reflection modes
- FPA imaging for fast chemical mapping
- Spatial resolution down to 1.25 µm in ATR mode
- FPA imaging upgrade capability
- Standard TE-MCT detector, with optional LN-MCT and DTGS detectors
- Up to two individual detectors can be used in parallel
- No need for liquid nitrogen or dry-air purging
- Automated Knife-Edge apertures
- 270° sample access from three sides
- OPUS software with AI-based identification and analysis functions
- Support for cGMP and FDA 21 CFR Part 11 requirements
Applications
LUMOS II is suitable for a wide range of industrial, research, and analytical applications, including:
- Particle and surface analysis
- Failure and defect analysis
- Polymers, plastics, and composite materials
- Pharmaceutical analysis
- Coating and thin-film analysis
- Microplastic analysis
- Material quality control
- Contamination analysis
- Forensic analysis
- Biological and life science applications
- Analysis of materials used in art conservation and restoration
- Materials research and product development
Technical Specifications
- Technology: FT-IR microscopy and IR imaging
- Detector: TE-MCT standard
- Optional detectors: LN-MCT, DTGS
- FPA detector: Yes
- Spatial resolution: Down to 1.25 µm in ATR mode
- FPA imaging speed: Up to 1.6 mm²/s
- IR laser imaging speed: Up to 4.5 mm²/s
- IR laser range: 1,800–950 cm⁻¹
- Measurement modes: ATR, transmission, and reflection
- Maximum sample height: Up to 40 mm
- Interferometer: RockSolid™
- Software: OPUS
- AI analysis: Autonomous Composition Identifier (A.I.D.)
- Sample access: 270° from three sides
- System: Designed for laboratory use and continuous operation
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