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    Bruker INVENIO series

    INVENIO is an advanced and flexible FT-IR spectrometer platform designed for a wide range of applications, from routine quality control and material identification to demanding research and development analyses. Thanks to its modular concept, the system can be tailored to specific user requirements through a choice of detectors, sources, accessories, and advanced measurement techniques.

    The platform combines high performance, reliability, and easy upgradeability, enabling precise analysis of various sample types and supporting applications across research, industry, and quality control.

    INVENIO-S

    INVENIO-R

    INVENIO-X

    TECHNICAL SPECIFICATIONS

    INVENIO-S

    INVENIO-S is an FT-IR spectrometer designed for advanced routine analysis and research. It combines ease of use with a flexible configuration and the possibility of expanding the system according to laboratory requirements.

    Advantages

    • RockSolid™ interferometer for high stability
    • High-sensitivity DigiTect™ detectors
    • Modular configuration
    • Transit™ channel for flexible sample analysis
    • Wide range of accessories
    • System upgradeability
    • Support for advanced FT-IR techniques

     

    Applications

    • Quality control
    • Material identification and characterization
    • Pharmaceutical and chemical industries
    • Polymers and materials
    • Research and development

     

    INVENIO-R

    INVENIO-R is a research FT-IR spectrometer designed for laboratories requiring high performance, flexibility, and advanced analytical capabilities. It can be adapted to different research applications and sample types.

    Advantages

    • High spectral resolution
    • Modular optical configuration
    • Wide selection of detectors and sources
    • Expandable spectral range
    • Support for advanced spectroscopic techniques
    • Integration with additional analytical systems
    • OPUS software for advanced data processing

     

    Applications

    • Research and development
    • Materials analysis
    • Chemical and pharmaceutical research
    • Polymers and composite materials
    • Reaction and kinetics analysis
    • Advanced sample characterization

     

    INVENIO-X

    INVENIO-X is the most flexible configuration of the INVENIO platform, designed for demanding research and development applications. It enables advanced FT-IR analysis with a wide selection of detectors, sources, and accessories.

    Advantages

    • Maximum configuration flexibility
    • Support for multiple detectors
    • Wide spectral range
    • Automated switching of optical components
    • High resolution and sensitivity
    • Support for advanced FT-IR techniques
    • FT-IR microscopy capabilities
    • Integration with TGA, GC, and other techniques
    • OPUS software for advanced analysis

     

    Applications

    • Advanced research and development
    • Materials science
    • Pharmaceutical research
    • Chemistry and catalysis
    • Polymers and nanomaterials
    • Analysis of complex and multi-component samples
    • Advanced spectroscopic research

     

    Technical Specifications

    • Technology: FT-IR spectroscopy
    • Interferometer: RockSolid™
    • Software: OPUS / OPUS TOUCH, depending on configuration
    • Detectors: Various configurations according to model and application
    • Spectral range: FIR to UV/VIS, depending on configuration
    • Additional techniques: FT-IR microscopy, TGA-FT-IR, GC-FT-IR, and others
    • Configuration: Modular and upgradeable
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