Bruker CTX
Bruker CTX – Portable Benchtop XRF Analyzer
Bruker CTX is a compact portable benchtop XRF analyzer designed for fast and reliable elemental analysis of prepared samples.
It enables the analysis of a wide range of materials, including metals, minerals, soil, fertilizers, powders, liquids, and other sample types. Depending on the configuration, CTX covers an elemental range from Mg to U and enables analysis of up to 48 elements per calibration.
Its compact dimensions, battery-powered operation, and rugged construction make it suitable for use in laboratories, production environments, and in the field.
ADVANTAGES
APPLICATIONS
TECHNOLOGY
TECHNICAL SPECIFICATIONS
VIDEO
Advantages
- Fast and non-destructive elemental analysis
- Compact and portable benchtop format
- Elemental range up to Mg–U
- Up to 48 elements per calibration
- SDD detector with graphene window
- High sensitivity for light elements
- Energy resolution of <145 eV
- Battery or mains-powered operation
- Integrated touchscreen display
- Rugged construction
- Dual safety protection system
- Suitable for laboratory, production, and field applications
Applications
Industry and Quality Control
Fast inspection of raw materials, production processes, and finished products, with the ability to perform analysis directly in the production environment.
Mining, Geology, and Geochemistry
Analysis of geological samples, minerals, and mineral resources, as well as rapid sample testing during field exploration.
Metallurgy
Identification and verification of the composition of metal materials and analysis of various samples from metallurgical processes.
Fuels and Oils
Sulfur analysis in fuels, oil testing, and determination of elements and additives in lubricants.
Agriculture
Analysis of soil, fertilizers, and plant materials, including the determination of nutrients and potential contaminants.
Analysis of Various Materials
CTX is suitable for the analysis of solid, powdered, and liquid samples in laboratory and industrial environments.
Technology
CTX uses a Silicon Drift Detector (SDD) with a graphene window, providing high sensitivity and excellent performance, particularly for light-element analysis.
The X-ray source uses a rhodium (Rh) anode, while the optimized X-ray beam geometry provides high measurement speed, sensitivity, and repeatability.
The SharpBeam™ system optimizes the X-ray beam for different measurement conditions, while DetectorShield™ protects the detector and contributes to stable, long-term instrument performance.
Technical specifications
Detector: SDD, 20 mm², graphene window
Energy Resolution: <145 eV at 450,000 cps
Elemental Range: Up to Mg–U, depending on configuration
Number of Elements: Up to 48 elements per calibration
X-ray Tube: Rh anode
CTX 800: 6–50 kV, 5–200 μA, 4 W
CTX 500: 15–40 kV, 5–100 μA, 2 W
CTX 500S: 15–29 kV, 5–100 μA, 2 W
Collimators: 3, 5, or 8 mm, depending on configuration
Filter: Automatic five-position filter on CTX 800
Display: 3.7″ LCD touchscreen, 640 × 480 px
Weight: Approximately 7.5 kg with battery
Power Supply: Li-ion battery / AC adapter
Safety: Sample sensor and lid-closed sensor
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