Bruker TRACER 5

Bruker TRACER 5 – Portable XRF Spectrometer

Bruker TRACER 5 is an advanced portable XRF spectrometer designed for fast, reliable, and non-destructive elemental analysis directly in the field or in the laboratory.

It is designed for users who require high sensitivity, flexibility, and full control over measurement parameters. TRACER 5 combines an advanced Silicon Drift Detector (SDD), a flexible X-ray source, and the ability to adapt measurement conditions to the characteristics of the specific sample.

The instrument enables elemental analysis from Na to U, while helium purging extends the elemental range from F to U. This makes it particularly suitable for applications in geology, geochemistry, materials research, archaeometry, conservation, and industry.

Its compact design, battery-powered operation, and low weight make it easy to use in the field, while its advanced configuration options provide users with a high degree of flexibility.

Category:

Handheld XRF

Download brochure

For more information about Bruker TRACER 5, please visit

ADVANTAGES

APPLICATIONS

TECHNOLOGY

TECHNICAL SPECIFICATIONS

VIDEO

Advantages

Fast and non-destructive elemental analysis
Direct on-site analysis
Elemental range from Na–U
Range from F–U with helium purging
Advanced SDD detector with graphene window
Energy resolution of <140 eV
Adjustable X-ray source voltage and current
Measurement atmosphere selection: air, vacuum, or helium
Interchangeable 3 mm and 8 mm collimators
Automatic five-position filter
Support for user-defined filters and secondary targets
Integrated camera for precise sample positioning
Easy operation via touchscreen display
Wi-Fi and USB connectivity
PC connectivity
Support for user-defined calibrations
Compact and portable design
Suitable for laboratory and field applications

Applications

Geology and Geochemistry

TRACER 5 is particularly well suited for geological and geochemical research, analysis of geological samples, and characterization of mineral resources.

The ability to perform analysis directly in the field enables rapid testing of large numbers of samples and supports decision-making based on results obtained directly at the sampling location.

Mineral Resource Exploration

The wide elemental range and flexible measurement settings enable the analysis of various mineral and geological samples.

TRACER 5 is suitable for the exploration and characterization of mineral resources, as well as for preliminary field assessment of samples.

Materials Research

Flexible adjustment of voltage, current, filters, collimators, and measurement atmosphere makes TRACER 5 suitable for research and characterization of various materials, as well as for the development of specific analytical methods.

Archaeometry and Cultural Heritage

Non-destructive XRF analysis enables the examination of works of art, archaeological artifacts, ceramics, pigments, and other historical materials without damaging the objects.

Conservation and Restoration

TRACER 5 can be used to identify elements in pigments, metals, glass, ceramics, and other materials found in works of art and historical objects.

Industry and Quality Control

The instrument enables rapid identification and characterization of materials, as well as quality control in various industrial and research processes.

Technology

TRACER 5 uses a Silicon Drift Detector (SDD) with a 20 mm² active area and graphene window. The graphene window provides efficient X-ray transmission, particularly for light elements.

The X-ray source uses a rhodium (Rh) anode, with voltage up to 50 kV and maximum power of 4 W. Voltage and current can be adjusted according to the requirements of the specific analysis.

The instrument offers a choice of 3 mm and 8 mm measurement areas, allowing the analysis to be adapted to the size and characteristics of the sample.

The automatic filter system features five positions, while an additional slot allows the use of user-selected filters or secondary targets.

One of the key features of the TRACER 5 system is the ability to select the measurement atmosphere. The instrument can operate in air, vacuum, or with helium purging, enabling the analysis of light elements down to fluorine.

Technical specifications

Detector: Silicon Drift Detector (SDD), 20 mm², graphene window

Energy Resolution: <140 eV

X-ray Tube: Rh anode

Maximum Voltage: 50 kV

Maximum Power: 4 W

Elemental Range: Na–U in air and vacuum; F–U with helium purging

Collimators: 3 mm and 8 mm

Filter: Automatic five-position filter

Additional Filters: Slot for user-selected filters and secondary targets

Camera: Integrated positioning camera

Display: Touchscreen