Bruker D8 ADVANCE Family
The D8 ADVANCE Family includes a range of hardware and software solutions for X-ray diffraction and scattering analysis, designed for the identification and detailed characterization of materials.
Depending on the configuration, the systems enable phase identification, quantitative phase analysis, microstructure and crystal structure analysis, residual stress and texture investigations, X-ray reflectometry, SAXS, PDF analysis, and micro-diffraction.
DIFFRAC.DAVINCI enables the selection of the optimal instrument configuration according to the analytical requirements, while DIFFRAC.SUITE provides tools for easy method setup, measurement, and advanced data processing.
The D8 ADVANCE Family includes the D8 ADVANCE, D8 ADVANCE ECO, D8 ADVANCE Plus, and D8 ADVANCE HE models, which are adapted to different materials, applications, and research requirements.
D8 ADVANCE
D8 ADVANCE ECO
D8 ADVANCE Plus
D8 ADVANCE HE
D8 ADVANCE
Bruker D8 ADVANCE is a flexible X-ray diffractometer designed for a wide range of XRD and scattering analyses. It supports various sample types, from powders and liquids to thin films and solid materials.
Key Features:
- XRD, PDF, SAXS, and WAXS analyses
- Flexible and modular configuration
- Automatic geometry change with TWIN/TRIO optics
- Dynamic Beam Optimization (DBO) for improved measurement results
- LYNXEYE XE-T and EIGER2 R detectors
- Analysis of powders, thin films, metals, batteries, pharmaceutical, and construction materials
- In-situ and operando measurement capabilities
- Automatic configuration changes without manual adjustment
- DIFFRAC.SUITE software for measurement and data analysis
For more information, please visit the manufacturer’s website
D8 ADVANCE Plus
Bruker D8 ADVANCE Plus is an advanced X-ray diffractometer designed for versatile materials research and characterization. It is suitable for the analysis of powders, bulk materials, fibers, flat samples, and thin films.
Key Features:
- Flexible configuration for various XRD applications
- TRIO optics with automatic switching between up to 6 beam geometries
- EIGER2 R 500K and LYNXEYE XE-T detectors
- XRD, PDF, SAXS/WAXS, and XRR analyses
- High-resolution XRD and reciprocal space mapping
- Analysis of thin films, stress, and texture
- In-situ and operando measurement capabilities
- Suitable for metals, construction materials, pharmaceuticals, chemicals, pigments, and batteries
- DIFFRAC.SUITE for measurement planning, execution, and analysis
For more information, please visit the manufacturer’s website
D8 ADVANCE HE
Bruker D8 ADVANCE HE is a high-energy X-ray diffractometer designed for advanced structural analysis and characterization of complex materials. It uses high-energy Mo or Ag radiation for greater penetration and analysis of samples that are challenging for standard XRD.
Key Features:
- High-energy Mo or Ag X-ray source
- Greater penetration for the analysis of complex and bulk samples
- LYNXEYE HE and EIGER2 R CdTe 500K detectors
- PDF (Pair Distribution Function) analysis
- Analysis of amorphous, nanostructured, and disordered materials
- In-situ and operando measurements
- Suitable for research on batteries, metals, catalysts, and other advanced materials
- DIFFRAC.SUITE for measurement setup and data analysis
For more information, please visit the manufacturer’s website
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