Bruker D8 DISCOVER Family
Bruker D8 DISCOVER is a flexible X-ray diffractometer designed for a wide range of XRD and scattering analyses in materials research. Depending on the configuration and available accessories, it can be used for phase and structural analysis, high-resolution XRD, reflectometry, reciprocal space mapping, GID, GISAXS, stress and texture analysis, as well as micro-diffraction.
DIFFRAC.DAVINCI enables easy selection and configuration of the instrument, while DIFFRAC.SUITE provides tools for method development, measurement, and data analysis.
The D8 DISCOVER family includes the D8 DISCOVER, D8 DISCOVER Plus, and D8 DISCOVER HE models, each designed to meet different research and analytical requirements.
Its spacious enclosure and flexible configuration options allow the system to be adapted to a wide range of experimental requirements.
D8 DISCOVER
D8 DISCOVER Plus
D8 DISCOVER HE
D8 DISCOVER
Bruker D8 DISCOVER is a versatile X-ray diffractometer for materials research and characterization. It is designed for a wide range of XRD analyses, including phase and structural analysis, thin-film analysis, stress and texture analysis, as well as micro-XRD.
Key Features:
- Flexible and modular configuration
- Samples up to 300 mm in diameter and 50 kg
- High-resolution XRD and micro-XRD analysis
- IµS Microfocus and Turbo X-ray sources
- EIGER2 and LYNXEYE XE-T detectors
- Suitable for industrial and academic research
- Supports the analysis of powders, thin films, metals, semiconductors, batteries, and other materials
For more information, please visit the manufacturer’s website
D8 DISCOVER Plus
Bruker D8 DISCOVER Plus is an advanced X-ray diffractometer for high-resolution XRD research and detailed materials characterization. It is designed for the analysis of thin films, surfaces, crystal structures, stress, and texture.
Key Features:
- High-resolution XRD analysis
- Flexible and modular configuration
- Thin-film and surface analysis
- Stress and texture analysis
- IµS Microfocus and Turbo X-ray sources
- EIGER2 and LYNXEYE XE-T detectors
- Suitable for research on semiconductors, batteries, metals, and other advanced materials
For more information, please visit the manufacturer’s website
D8 DISCOVER HE
Bruker D8 DISCOVER HE is a high-energy XRD system designed for advanced structural analysis and characterization of complex materials. Thanks to its Mo or Ag X-ray source, it provides greater X-ray penetration and enables the analysis of samples that are difficult to examine using conventional XRD methods.
Key Features:
- High-energy Mo or Ag X-ray source
- Greater penetration for the analysis of complex and large samples
- LYNXEYE HE and EIGER2 R CdTe 500K detectors
- Analysis of amorphous, nanostructured, and disordered materials
- PDF (Pair Distribution Function) analysis
- In-situ and operando measurements, including battery analysis during operation
- High data acquisition speed
- Flexible configurations for different sample types and experimental conditions
- DIFFRAC.SUITE for measurement setup and data analysis
D8 DISCOVER HE is part of the D8 DISCOVER family and is designed for demanding research applications where conventional XRD systems are not sufficient.
For more information, please visit the manufacturer’s website
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