Bruker M4 TORNADO

Bruker M4 TORNADO – Micro-XRF Spectrometer

Bruker M4 TORNADO is a high-performance Micro-XRF spectrometer designed for precise and fast elemental analysis of solid, powdered, and liquid samples.

It enables analysis of very small areas with a measurement spot size of less than 20 µm, as well as point, line, and area analysis with 2D elemental mapping. The system provides detailed information on elemental composition and distribution, including areas beneath the sample surface.

Category:

Micro XRF

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ADVANTAGES

APPLICATIONS

TECHNOLOGY

TECHNICAL SPECIFICATIONS

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Advantages

Measurement spot size <20 µm
Fast point, line, and area analysis
2D elemental mapping
Minimum measurement time of up to 1 ms per pixel
Stage speed of up to 100 mm/s
Analysis of samples weighing up to 7 kg
Mapping area of up to 190 × 160 mm
High-throughput SDD detectors
Option to use two detectors simultaneously
Capability for multilayer analysis
Optional helium purge for improved analysis of light elements
Optional second X-ray tube for extended analytical capabilities
Software for qualitative and quantitative analysis

Applications

Geology and Geochemistry

Analysis of minerals, rocks, thin sections, and drill cores, including detailed mapping of elemental distribution and mineral phases.

Mining and Mineralogy

Characterization of mineral phases and rapid determination of the elemental composition of samples.

Industry and Materials

Analysis of metals, alloys, ceramics, construction materials, particles, and other industrial samples.

Coatings and Multilayer Systems

M4 TORNADO enables analysis of layer composition and thickness, including multilayer systems.

Art and Cultural Heritage

Non-destructive analysis of pigments, artworks, historical objects, and other cultural heritage materials.

Biology and Food Products

Elemental analysis of plants, food, and other organic materials.

Technology

M4 TORNADO uses polycapillary X-ray optics to focus the X-ray beam onto a measurement spot smaller than 20 µm, providing high X-ray intensity.

Bruker XFlash® SDD detectors provide high data acquisition rates with an energy resolution of <145 eV.

The TurboSpeed stage enables fast scanning and on-the-fly measurements, while HyperMap technology allows complete spectral data to be collected and stored for subsequent analysis.

For extended analytical capabilities, the system can be equipped with a second X-ray tube, helium purge, XMethod for layer quantification, and AMICS software for automated mineral analysis.

Technical specifications

Sample Types: Solid materials, particles, and liquids

Measurement Spot Size: <20 µm

Detector: XFlash® SDD, 30 mm²; optional second detector and 60 mm² detector

Energy Resolution: <145 eV

Elemental Range: Na–Am, depending on configuration

X-ray Tube: Rh anode, 50 kV, 30 W

Optional Second Tube: Up to 50 kV, 40 W

Stage Speed: Up to 100 mm/s

Minimum Measurement Time per Pixel: 1 ms

Mapping Area: Up to 190 × 160 mm

Maximum Sample Weight: 7 kg