Bruker M6 JETSTREAM

Bruker M6 JETSTREAM – Large Area micro-XRF Scanner in High Definition

M6 JETSTREAM is an advanced micro-XRF system designed for fast and non-destructive mapping of the elemental composition of large and complex samples. It combines high spatial resolution, a large scanning area, and exceptionally fast data acquisition.

Thanks to its mobile design and adjustable frame, analyses can be performed directly on-site, eliminating the need to transport large, heavy, or particularly valuable objects to a laboratory.

Large Area. High Resolution. Fast Analysis.

M6 JETSTREAM enables micro-XRF analysis of areas up to 800 × 600 mm, with an adjustable beam size ranging from 100 to 500 µm.

The system is designed for fast large-area mapping, enabling comprehensive information on elemental distribution to be collected in a single measurement.

Category:

Micro XRF

Download brochure

For more information about Bruker M6 JETSTREAM, please visit

ADVANTAGES

APPLICATIONS

TECHNICAL SPECIFICATIONS

Advantages

Scanning area of up to 800 × 600 mm
Adjustable beam size: 100–500 µm
Fast on-the-fly mapping
Analysis of both horizontal and vertical surfaces
Mobile design for on-site analysis
Optional dual SDD detector configuration for even faster data acquisition

Applications

M6 JETSTREAM is particularly well suited for the analysis of large, valuable, or immovable samples.

Cultural Heritage and Art

Analysis of paintings and works of art
Pigment identification
Examination of layers and previous interventions
Detection of hidden details and changes in composition
Analysis of historical and archaeological objects

Geology

Elemental composition mapping of large geological samples
Analysis of minerals and elemental distribution

Industry

Analysis of large industrial components
Material characterization and quality control
Fast mapping of surfaces and inhomogeneities

Archaeology and Paleontology

Non-destructive analysis of artifacts
Elemental mapping of fossils and other complex samples

Technical Specifications

System type: Large-area micro-XRF scanner
Max. scanning area: 800 × 600 mm
Beam size: 100–500 µm
Stage speed: Up to 100 mm/s
Minimum time per pixel: Up to 1 ms
Detectors: Bruker XFlash® SDD
SDD detector area: 30 or 60 mm²; optional up to 2 × 60 mm²
Energy resolution: ≤145 eV at Mn Kα
Measurement: Horizontal and vertical surfaces
Tilt adjustment: ±10° in vertical mode
Option: Aperture Management System (AMS)