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    Bruker RAM II

    Bruker RAM II – FT-Raman Module

    Bruker RAM II is an advanced FT-Raman module that can be coupled with Bruker INVENIO and VERTEX FT-IR research spectrometers. It combines FT-Raman and FT-IR capabilities within a single system, with automated switching between measurement techniques via OPUS software. The system is designed for demanding research applications requiring high sensitivity, stability, and measurement flexibility.

    ADVANTAGES

    APPLICATIONS

    TECHNICAL SPECIFICATIONS

    Advantages

    • Dual-channel FT-Raman module
    • Compatible with INVENIO and VERTEX FT-IR research spectrometers
    • Automated switching between FT-Raman and FT-IR measurements
    • Advanced 24-bit detector electronics
    • High-quality optics for excellent stability and throughput
    • Support for a second laser and detection system
    • Automated polarization accessory
    • Two fiber-optic coupling ports
    • Optional 90° scattering geometry
    • Defocusing optics for safe analysis of colored samples
    • Motorized sample stage for precise sample positioning
    • Optional automatic sample changers and temperature-controlled stages
    • Possibility to combine with RamanScopeIII and SENTERRA II microscopes
    • Dedicated configuration for photoluminescence (PL) applications
    • OPUS software for measurement control and data processing

    Applications

    RAM II is suitable for demanding Raman spectroscopy applications, including:

    • Materials research and development
    • Chemical and pharmaceutical research
    • Semiconductor research and quality control
    • Advanced material characterization
    • Analysis of colored and fluorescent samples
    • Photoluminescence studies
    • Combined FT-IR/FT-Raman analysis
    • Microscopic Raman analysis
    • Research into optical and advanced materials

    Technical Specifications

    • Technology: FT-Raman spectroscopy
    • Spectral range: 3600–50 cm⁻¹ (Stokes shift)
    • Laser: Nd:YAG, 1064 nm
    • Detectors: Room-temperature InGaAs and high-sensitivity Ge detector
    • Ge detector: Liquid-nitrogen-cooled germanium detector
    • Detector electronics: 24-bit
    • Configuration: Dual-channel
    • Scattering geometry: Standard and optional 90°
    • Laser control: Fully software-controlled
    • Sample stage: Motorized
    • Software: OPUS
    • Optional accessories: Second laser, additional detection system, automated polarization accessory, automatic sample changer, low- and high-temperature stages
    • Additional applications: Photoluminescence (PL) and microscopic Raman spectroscopy
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